Sensitivity and resolution in optical coherence micro-elastography

Chin, Lixin; Curatolo, Andrea; Wijesinghe, Philip; Kennedy, Kelsey M.; McLaughlin, Robert A.; Kennedy, Brendan F.; Sampson, David D.

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Sensitivity and resolution in optical coherence micro-elastography

Date

2015-11-09

Authors

McLaughlin, Robert A.

Kennedy, Brendan F.

Sampson, David D.

Abstract

This study describes a framework for characterizing resolution and sensitivity in optical coherence micro-elastography, and presents a means of optimizing these parameters through spatial filtering. Results show improved axial resolution with no loss in sensitivity.