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Near-Field Optical Investigations of Photonic Crystal Microresonators

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Date

2004

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Abstract

We present an overview of our work on the application of scanning near-field optical microscopy (SNOM) to photonic crystal structures. Our results show that SNOM can be used to map the subwavelength confinement of light to a point-defect in a 2D photonic crystal microresonator. Comparison with numerical modelling shows that SNOM is able to resolve patterns in the intensity distribution that are due to the slight non-uniformity in the crystal structure. We also discuss the future possibilities for applications of different modes of SNOM to photonic crystal devices.

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Keywords

Microresonator, Photonic crystal, Point defect, SNOM, Scanning near-field optical microscopy

Citation

URI

https://dspace-test.anu.edu.au/handle/1885/733757853

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DevOps Pure Testing

Source

IEICE Transactions on Electronics

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