In-Situ Single-Photon Detection of Er Sites in Si

Berkman, Ian R.; Lyasota, Alexey; de Boo, Gabriele G.; Bartholomew, John G.; Johnson, Brett C.; McCallum, Jeffrey C.; Xu, Bin Bin; Xie, Shouyi; Ahlefeldt, Rose L.; Sellars, Matthew J.; Yin, Chunming; Rogge, Sven

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In-Situ Single-Photon Detection of Er Sites in Si

Date

2022

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Abstract

Using sample-on-SSPD and photoluminescence excitation spectroscopy, we demonstrate Er sites in Si with inhomogeneous broadening below 100 MHz, a 350 kHz upper bound on the homogeneous linewidth, and electron T1 lower bound of 1 second.

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https://dspace-test.anu.edu.au/handle/1885/733724194

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DevOps Pure Testing

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Optics InfoBase Conference Papers

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Conference article

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In-Situ Single-Photon Detection of Er Sites in Si

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