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Controllable nanostructures on La0.7Sr0.3MnO 3 thin film surfaces formed by scanning tunneling microscopy

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Date

2010

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Abstract

Nanoscale structuring on La0.7Sr0.3MnO3 (LSMO) thin film surfaces has been performed by scanning tunneling microscopy (STM) under ambient conditions. From line etching experiments we found that the line-depth increases in a stepwise fashion with increasing bias voltage. It also increases with decreasing scan speed and increasing scan repetition. We observed that the line-depth is an integral multiple of the LSMO out-of-plane lattice constant about 0.4 nm. Lateral structure with minimum feature size of 1 nm is possible to obtain. In addition, a four-level inverse-pyramid structure has been created on LSMO thin film surfaces. Our work shows the feasibility of using STM to fabricate controllable and complex nanostructures in LSMO thin film.

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Keywords

LaSrMnO, Nanostructures, Scanning tunneling microscopy

Citation

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https://dspace-test.anu.edu.au/handle/1885/733740880

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DevOps Pure Testing

Source

Microelectronic Engineering

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Article

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DOI

10.1016/j.mee.2010.03.002

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