Test environment running 7.6.6

Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Applications of ion implantation in III-V device technology

Abstract

The use of implantation for doping and isolation of a variety of electronic and photonic III-V compound semiconductor devices will be reviewed. Complex multilayer heterostructure devices like heterojunction bipolar transistors and strained InGaAs-GaAs quantum well lasers rely on keV or MeV isolation implants, requiring thick, easily removed masks and post-implant annealing treatments to achieve high isolation resistances (≥ 108 Ω cm). The effectiveness of the implant isolation technique varies as a function of the bandgap and elemental composition of the semiconductor. Devices based on GaAs, AlxGa1-xAs and InGaP are particularly suited to the implant isolation method. The prime dopant species for III-V materials are Si for n-type layers and Be for p-type layers, although there is increasing interest in the use of C as an acceptor because of its low diffusivity. In the latter case, a group III species must be co-implanted with the C+ ion to enhance the occupation of the group V lattice site.

Description

Keywords

Citation

Source

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Book Title

Entity type

Access Statement

License Rights

Restricted until