Direct Characterization of Axial p-n Junctions for InP Nanowire Array Solar Cells Using Electron Beam-Induced Current

Gao, Qian; Fu, Lan; Li, Li; Vora, Kaushal; Li, Ziyuan; Wang, Fan; Li, Zhe; Wenas, Yesaya; Mokkapati, Sudha; Karouta, Fouad; Tan, Hark Hoe; Jagadish, Chennupati

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Direct Characterization of Axial p-n Junctions for InP Nanowire Array Solar Cells Using Electron Beam-Induced Current

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2015

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Electron beam-induced current (EBIC) technique combined with simulations were used to study the axial p-n junctions of InP nanowire array solar cells. Photovoltaic devices have also been fabricated and characterized to confirm the EBIC results.

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https://dspace-test.anu.edu.au/handle/1885/733725384

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DevOps Pure Testing

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Direct Characterization of Axial p-n Junctions for InP Nanowire Array Solar Cells Using Electron Beam-Induced Current

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