Test environment running 7.6.6

Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Debris studies for the tin-based droplet laser-plasma EUV source

dc.contributor.authorTakenoshita, K.en
dc.contributor.authorKoay, C. S.en
dc.contributor.authorTeerawattanasook, S.en
dc.contributor.authorRichardson, M.en
dc.date.accessioned2025-03-24T06:25:02Z
dc.date.available2025-03-24T06:25:02Z
dc.date.issued2004en
dc.description.abstractWe are developing a mass-limited, laser plasma target concept that utilizes excited state transitions in tin ions as the source of 13.5 nm radiation, offering in-band conversion efficiencies greater than 1%. The ultimate objective of this EUV source strategy is the utilization of a target that is completely ionized by the laser. To determine the viability of this source for EUVL, we are making extensive measurements of the debris emanating from the target. Here we report on some of these measurements. Also under investigation are various methods of debris mitigation. We have previously shown the effectiveness of electrostatic fields for repelling ions from mass-limited targets, demonstrating improvements in multilayer mirror lifetimes in excess of an order of magnitude, positioning water droplet targets within reach of the EUVL roadmap requirements. Our investigation of debris utilizes various diagnostic techniques including ion collection, ion sputtering and witness-plate capture of particulate debris, and extensive post-mortem microscopic materials analysis.en
dc.description.statustrueen
dc.format.extent10en
dc.identifier.otherScopus:3843147185en
dc.identifier.urihttps://dspace-test.anu.edu.au/handle/1885/733733670
dc.identifier.urlhttp://www.scopus.com/inward/record.url?scp=3843147185&partnerID=8YFLogxKen
dc.language.isoEnglishen
dc.sourceProceedings of SPIE - The International Society for Optical Engineeringen
dc.subjectDebrisen
dc.subjectEuv sourceen
dc.subjectInhibitionen
dc.subjectIon spectraen
dc.subjectMitigationen
dc.subjectTin plasmaen
dc.titleDebris studies for the tin-based droplet laser-plasma EUV sourceen
dc.typeConference articleen
local.bibliographicCitation.lastpage963en
local.bibliographicCitation.startpage954en
local.contributor.affiliationTakenoshita, K.; University of Central Floridaen
local.contributor.affiliationKoay, C. S.; University of Central Floridaen
local.contributor.affiliationTeerawattanasook, S.; University of Central Floridaen
local.contributor.affiliationRichardson, M.; University of Central Floridaen
local.identifier.citationvolume5374en
local.identifier.doi10.1117/12.541533en
local.identifier.pure34b00969-3901-45d0-91b2-390b85f6c28cen
local.type.statusPublisheden

Downloads