Test environment running 7.6.6

Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Multi-channel digital demodulator for LVDT and RVDT position sensors

Abstract

The authors present the architecture, VLSI implementation and test results of a mixed analog-digital multichannel digital demodulator for a linear-variable-differential-transformer (LVDT) position sensor. The monolithic multichannel demodulator has four signal channels for demodulation and a built-in-test (BIT) channel. Each channel has a 12-bit Δ-Σ oversampled analog-to-digital converter (ADC) implemented with switched-capacitor circuits, and a dedicated digital demodulator with a 32-bit wordlength. The outputs from the ADCs are processed by digital processors. The digital demodulator uses a novel adaptive AM demodulation algorithm based on prediction techniques. A bit-serial silicon compiler is used to complete the design. The design was fabricated in a 1.2-μm bulk CMOS process and contains 85,000 transistors in a die size of 325 × 330 mils2. Test results show that absolute accuracies of ±0.2% were achieved without the need for calibration.

Description

Keywords

Citation

Source

Proceedings of the Custom Integrated Circuits Conference

Book Title

Entity type

Access Statement

License Rights

DOI

Restricted until