Test environment running 7.6.6

Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

2.5 v 43-45 Gb/s CDR circuit and 55 Gb/s PRBS generator in SiGe using a low-voltage logic family

Loading...
Thumbnail Image

Date

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

An alternative design approach for implementing high-speed digital and mixed-signal circuits is proposed. It is based on a family of low-voltage logic gates with reduced transistor stacking compared to series-gated emitter-coupled logic. It includes a latch, an XOR gate, and a MUX with mutually compatible interfaces. Topologies and characteristics of the individual gates are discussed. Closed-form propagation delay expressions are introduced and verified with simulations. The proposed design style was used to implement a 43-45 Gb/s CDR circuit with a 600 MHz locking range and a 55 Gb/s PRBS generator with a 2 7 -1 sequence length. The circuits were fabricated in a SiGe BiCMOS technology with f T = 120 GHz. Corresponding measurement results validate the proposed design style and establish it as a viable alternative to emitter-coupled logic in high-speed applications. Both circuits operate from a 2.5 V nominal power supply and consume 650 mW and 550 mW, respectively.

Description

Citation

Source

IEEE Journal of Solid-State Circuits

Book Title

Entity type

Access Statement

License Rights

Restricted until