Refractive index modifications in chalcogenide films induced by sub-bandgap near-IR femtosecond pulses
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Abstract
Refractive index modifications of film Ge0.23Sb0.07S0.7 induced by 800nm femtosecond laser irradiation are studied for laser repetition rates of 1kHz and 80MHz. Measurements are taken using an interferometric method and analysis of the transmission spectra.