Using Managed Runtime Systems to Tolerate Holes in Wearable Memories

Gao, Tiejun; Strauss, Karin; Blackburn, Stephen; McKinley, Kathryn S.; Burger, Doug; Larus, James

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Using Managed Runtime Systems to Tolerate Holes in Wearable Memories

Date

2013

Authors

Gao, Tiejun

Strauss, Karin

Blackburn, Stephen

McKinley, Kathryn S.

Burger, Doug

Larus, James

Publisher

Association for Computing Machinery (ACM)

Abstract

New memory technologies, such as phase-change memory (PCM), promise denser and cheaper main memory, and are expected to displace DRAM. However, many of them experience permanent failures far more quickly than DRAM. DRAM mechanisms that handle permanent fa

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http://hdl.handle.net/1885/66262

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Open Access Research

Source

Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI)

Type

Conference paper

DOI

10.1145/2499370.2462171

Restricted until

2037-12-31

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01_Gao_Using_Managed_Runtime_Systems_2013.pdf (239.07 KB)

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Using Managed Runtime Systems to Tolerate Holes in Wearable Memories

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