Optimal and robust quantum-enhanced metrologywithout echoes

Nolan, Samuel; Haine, Simon; Szigeti, Stuart

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Optimal and robust quantum-enhanced metrologywithout echoes

Date

2017

Authors

Nolan, Samuel

Haine, Simon

Szigeti, Stuart

Abstract

We show that optimal and robust quantum metrology can be achieved without echoes. Specifically, we explore optimal measurement strategies with and without detection noise, and in both situations, find that echoes are unnecessary.